| 000 | 00706nam a2200205Ia 4500 | ||
|---|---|---|---|
| 001 | 0000018784 | ||
| 008 | 150323 ii eng | ||
| 020 | _a8172248911 | ||
| 090 | 0 | 0 |
_a621.381 _bDIG _c2007 |
| 245 | 1 | 0 |
_aDIGITAL systems testing and testable design _cedited by Miron Abramovici, Melvin A. Breuer, Arthur D.Friedman. |
| 260 |
_aMumbai,India _bJAICO Publishing House _c2007 |
||
| 300 |
_axviii,652p. _bill. _c24cm. |
||
| 500 | _aIncludes index | ||
| 650 | 0 |
_aDigital integrated circuits _xDesign and construction |
|
| 650 | 0 |
_aDigital integrated circuits _xTesting |
|
| 650 | 0 | _aElectonic books | |
| 700 | 0 | _aAbramovici,Miron | |
| 700 | 0 | _aBreuer,Melvin A. | |
| 700 | 0 | _aFriedman,Arthur D. | |
| 999 |
_c56294 _d56294 |
||