000 00560nam a2200193Ia 4500
001 0000001320
008 231110s9999 xx 000 0 und d
020 _a140204366x
090 0 0 _a537.24
_bDEF
_c2006
245 1 0 _aDefects in high-k gate dielectric stacks
_cedited by Evgeni Gusev
260 _aDordrecht
_bSpringer
_cc2006
300 _ax,492p.:
_bill.;
_c25cm
504 _aIncludes bibliographical references and index
650 1 0 _aSemiconductors
650 2 0 _aDEP, DTK
650 2 0 _aDielectrics
700 1 _aTitle
700 1 _axx, 686 p.
_bill.
_c24 cm
999 _c3964
_d3964