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OPTICAL inspection of microsystems edited by Wolfgang Osten

By: Contributor(s): Material type: TextTextPublication details: Hoboken, N.J. John Wiley & Sons, Ltd. c2007.Description: xiii, 258 p., [8] p. of plates ill. 24 cmISBN:
  • 9780470152638
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode
Buku Buku PERPUSTAKAAN TAN SRI OTHMAN MERICAN, POLITEKNIK UNGKU OMAR Koleksi Umum (Rak Terbuka) 330.9730 BRU (Browse shelf(Opens below)) 39573 Available 0000043647
Buku Buku PERPUSTAKAAN TAN SRI OTHMAN MERICAN, POLITEKNIK UNGKU OMAR Koleksi Umum (Rak Terbuka) 330.9730 BRU (Browse shelf(Opens below)) 41796 Available 0000044230

Includes bibliographical references (p. 195-243) and indexes

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