DIGITAL systems testing and testable design 
edited by Miron Abramovici, Melvin A. Breuer, Arthur D.Friedman.    
 - Mumbai,India  JAICO Publishing House  2007 
 - xviii,652p.  ill.  24cm. 
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>8172248911 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits--Design and construction<br/>Digital integrated circuits--Testing<br/>Electonic books