Bruner, Robert F.  1949- <br/><br/>
OPTICAL inspection of microsystems 
edited by Wolfgang Osten 
 - Hoboken, N.J.  John Wiley & Sons, Ltd.  c2007. 
 - xiii, 258 p., [8] p. of plates  ill.  24 cm. 
<br/><br/>Includes bibliographical references  (p. 195-243) and indexes 
<br/><br/><label>ISBN: </label>9780470152638 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Depressions--United States.--1907<br/>Financial crises--History--United States--20th century.<br/>Stock exchanges--History--United States--20th century.