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Defects in high-k gate dielectric stacks edited by Evgeni Gusev

Contributor(s): Material type: TextTextPublication details: Dordrecht Springer c2006Description: x,492p.: ill.; 25cmISBN:
  • 140204366x
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode
Buku Buku PERPUSTAKAAN TAN SRI OTHMAN MERICAN, POLITEKNIK UNGKU OMAR Koleksi Umum (Rak Terbuka) 537.24 DEF (Browse shelf(Opens below)) 32831 Available 0000041565

Includes bibliographical references and index

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