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DEFECTS in high-k gate dielectric stacks edited by Evgeni Gusev

Contributor(s): Material type: TextTextPublication details: Dordrecht Springer c2006Description: x,492p.: ill.; 25cmISBN:
  • 1402043651
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode
Red Spot PERPUSTAKAAN TAN SRI OTHMAN MERICAN, POLITEKNIK UNGKU OMAR BOK 537.24 DEF (Browse shelf(Opens below)) 32830 Available 0000041561

Includes bibliographical references and index

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