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X- Ray metrology in semiconductor manufacturing D. Keith Bowen, Brian K. Tanner

By: Contributor(s): Material type: TextTextPublication details: New York CRC Press c2006Description: 279p.: ill.; 24cmISBN:
  • 0849339286
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode
Buku Buku PERPUSTAKAAN TAN SRI OTHMAN MERICAN, POLITEKNIK UNGKU OMAR Koleksi Umum (Rak Terbuka) 621.3815 BOW (Browse shelf(Opens below)) 32804 Available 0000041756

Includes bibliographical references and index

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