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OPTICAL inspection of microsystems edited by Wolfgang Osten

Contributor(s): Material type: TextTextPublication details: London CRC Press c2006Description: 503p.: ill.; 25cmISBN:
  • 0849336821
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Item type Current library Collection Call number Copy number Status Date due Barcode
Buku Buku PERPUSTAKAAN TAN SRI OTHMAN MERICAN, POLITEKNIK UNGKU OMAR Koleksi Umum (Rak Terbuka) 670.425 OPT (Browse shelf(Opens below)) 32076 Available 0000041718

Includes bibliographical references and index

Structural analysis a unified classical and matrix approach A.Ghali, A. M. Neville and T. G. Brown

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