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OPTICAL inspection of microsystems edited by Wolfgang Osten

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Material type: Text

TextPublication details: London CRC Press c2006Description: 503p.: ill.; 25cmISBN:

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Item type	Current library	Collection	Call number	Copy number	Status	Date due
Buku	PERPUSTAKAAN TAN SRI OTHMAN MERICAN, POLITEKNIK UNGKU OMAR	Koleksi Umum (Rak Terbuka)	670.425 OPT (Browse shelf(Opens below))	32076	Available

Includes bibliographical references and index

Structural analysis a unified classical and matrix approach A.Ghali, A. M. Neville and T. G. Brown

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